Quality and Reliability Testing Laboratory

  • For all jobs, please fill the Work Request Form (MS Word,PDF), print it and bring it to the bond lab.
  • The handling of irradiated, radioactive or potentially hazardous components has to follow special procedures, so please fill the Work Request Form Appendix A “Radioactive Material”(MS Word,PDF).

Reliability testing and Quality Assurance

ALT

ESS

Burn-in

So, what is the difference?

ALT

ESS

Burn-in

Some Mechanical Failure MechanismsSome Failure Mechanisms in Electronics
FatigueCorrosion
WearElectromigration
Expansion-Contraction FatigueThermal Fatigue
Corrosion

Example

(Source: Sony Semiconductor Network Comp.)
Failed partFailure ModeFailure Mechanism
ChipOPEN
  • Aluminium wiring disconnection (corrosion, migration)
  • Bonding pad corrosion
  • Bond peeling (formation of Au-Al and other intermetallic compounds)
ChipSHORTS or LEAKS
  • Oxide film breakdown or pinhole
  • Electrostatic breakdown
  • Chip cracking
  • PN junction
ChipIC FUNCTION FAILURE
  • Hot electron or hot carrier injection to the oxide film
  • Surface inversion
  • Crystal defect
  • Contamination within the process degradation
  • Moisture absorption
PackageOPEN
  • Bonding wire disconnection or peeling
  • Lead dirtiness, stress due to oxidation or absorbed moisture + heat stress
PackagePackage cracking, shorts or leaks
  • Delamination between the chip or lead frame and mold resin
  • Wire touching (contact between the wires, chip and lead frame)
  • Electrochemical migration between leads
PackageSoldering defect
  • Surface contamination or oxidation
  • Creep
  • Flux residues

Relationships

Stress StimulusReason for Utilization
High Temperature
  • Diffusion processes on silicon
  • Oxidation of fractures
  • Poor timing margins
Low Temperature
  • Component and design margin problems not initiated at elevated temperatures
Temperature Cycling
  • – Interconnection – solder joints, wire and ball bonds
  • Poor timing margins
Power Cycling
  • Enhanced rate of temperature ramp-up and ramp-down during temperature cycling
Vibration and Mechanical Shock
  • Cabling and connector problems
  • Poorly secured large mass components
  • Structure cracking
Elevated Humidity
  • Isolation breakdown
  • Corrosion